Efficient pattern generation for transition-fault diagnosis using combinational circuit model

Yi Da Wang, Kuen-Jong Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

An efficient diagnosis procedure to distinguish non-equivalent transition faults and identify equivalent transition faults is proposed. This procedure consists of three main methods. The Fault Inactivation Method (FIM) generates diagnosis patterns to distinguish fault pairs by inactivating one fault and detecting the other for each fault pair, the Fault Pair Filter Method (FPF) quickly identifies a large portion of equivalent-fault pairs after FIM, and the Fault Propagation Method (FPM) generates diagnosis patterns for the remaining distinguishable fault pairs and identifies equivalent-fault pairs by initializing both faults in each pair simultaneously and creating distinguishable faulty responses. Experimental results show that only 6 out of more than 7.48∗108 fault pairs in ISCAS89 benchmark circuits cannot be handled by this method, i.e., a diagnosis resolution of higher than 99.999999%is achieved.

Original languageEnglish
Title of host publicationProceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014
EditorsJia Zhou, Ting-Ao Tang
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479932962
DOIs
Publication statusPublished - 2014 Jan 23
Event2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014 - Guilin, China
Duration: 2014 Oct 282014 Oct 31

Publication series

NameProceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014

Other

Other2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014
CountryChina
CityGuilin
Period14-10-2814-10-31

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All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

Wang, Y. D., & Lee, K-J. (2014). Efficient pattern generation for transition-fault diagnosis using combinational circuit model. In J. Zhou, & T-A. Tang (Eds.), Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014 [7021499] (Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSICT.2014.7021499