Efficient Prognostication of Pattern Count with Different Input Compression Ratios

Fong Jyun Tsai, Chong Siao Ye, Yu Huang, Kuen Jong Lee, Wu Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski

Research output: Chapter in Book/Report/Conference proceedingConference contribution


A novel method to efficiently and accurately prognosticate the pattern count at different input compression ratios with the Embedded Deterministic Test (EDT) compression technology is proposed. With this method the total ATPG run time can be significantly reduced compared to the currently used trial-and-error method.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE European Test Symposium, ETS 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728143125
Publication statusPublished - 2020 May
Event2020 IEEE European Test Symposium, ETS 2020 - Tallinn, Estonia
Duration: 2020 May 252020 May 29

Publication series

NameProceedings of the European Test Workshop
ISSN (Print)1530-1877
ISSN (Electronic)1558-1780


Conference2020 IEEE European Test Symposium, ETS 2020

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Software

Cite this