@inproceedings{77168226ac3a4c6fadef28a661b52f95,
title = "Efficient Prognostication of Pattern Count with Different Input Compression Ratios",
abstract = "A novel method to efficiently and accurately prognosticate the pattern count at different input compression ratios with the Embedded Deterministic Test (EDT) compression technology is proposed. With this method the total ATPG run time can be significantly reduced compared to the currently used trial-and-error method.",
author = "Tsai, \{Fong Jyun\} and Ye, \{Chong Siao\} and Yu Huang and Lee, \{Kuen Jong\} and Cheng, \{Wu Tung\} and Reddy, \{Sudhakar M.\} and Mark Kassab and Janusz Rajski",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 2020 IEEE European Test Symposium, ETS 2020 ; Conference date: 25-05-2020 Through 29-05-2020",
year = "2020",
month = may,
doi = "10.1109/ETS48528.2020.9131586",
language = "English",
series = "Proceedings of the European Test Workshop",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - 2020 IEEE European Test Symposium, ETS 2020",
address = "United States",
}