Abstract
The sample size is directly proportional to the time taken during inspection, while the error due to discretization relates to the quality of the process. This paper investigates two deterministic sequences of numbers, as sample coordinates, by presenting their computations and their applications to metrology. Results show a dramatic improvement in both the number of and the error in measurements.
Original language | English |
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Pages (from-to) | 345-354 |
Number of pages | 10 |
Journal | Journal of Manufacturing Systems |
Volume | 14 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1995 |
All Science Journal Classification (ASJC) codes
- Software
- Control and Systems Engineering
- Hardware and Architecture
- Industrial and Manufacturing Engineering