Efficient sampling for surface measurements

T. C. Woo, R. Liang, C. C. Hsieh, N. K. Lee

Research output: Contribution to journalArticlepeer-review

68 Citations (Scopus)

Abstract

The sample size is directly proportional to the time taken during inspection, while the error due to discretization relates to the quality of the process. This paper investigates two deterministic sequences of numbers, as sample coordinates, by presenting their computations and their applications to metrology. Results show a dramatic improvement in both the number of and the error in measurements.

Original languageEnglish
Pages (from-to)345-354
Number of pages10
JournalJournal of Manufacturing Systems
Volume14
Issue number5
DOIs
Publication statusPublished - 1995

All Science Journal Classification (ASJC) codes

  • Software
  • Control and Systems Engineering
  • Hardware and Architecture
  • Industrial and Manufacturing Engineering

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