Efficient testing and design-for-testability schemes for multimedia cores: A case study on DCT circuits

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2 Citations (Scopus)

Abstract

Efficient test generation methods and design-for-testability schemes are critical to ensure the quality of multimedia cores. By investigating the potential test problems existing in these cores, this paper presents a series of efficient test methods to significantly reduce the test application time for these cores while obtaining 100% fault coverage. The test development procedure is demonstrated by employing a well-known 2-D discrete cosine transform (DCT) circuit that is implemented in the typical row-column decomposition method. The 100% fault coverage is first achieved by appropriately modifying the original design, including scan design insertion and some ad hoc revisions. We then apply the recently-developed input reduction method and the broadcasting scan method to overcome the deficiency of long test application time when inserting scan design into the circuits. With these two methods, the test application time can be reduced to 6.8% of those required by the single full scan designs, while only 7.9% area overhead is needed.

Original languageEnglish
Pages177-180
Number of pages4
Publication statusPublished - 2004 Dec 1
Event2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology - Tainan, Taiwan
Duration: 2004 Dec 62004 Dec 9

Other

Other2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology
CountryTaiwan
CityTainan
Period04-12-0604-12-09

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Shieh, M. D., Shen, S. C., Lin, Y. C., & Lee, K. J. (2004). Efficient testing and design-for-testability schemes for multimedia cores: A case study on DCT circuits. 177-180. Paper presented at 2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology, Tainan, Taiwan.