Electric current-induced plastic deformation: An in situ experimental study

Yu Chen Liu, Shih-kang Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recent study has shown that electron flow would induce a non-uniform lattice strain along the strip and the electric current stress-induced deformation is suggested to have the same context with the conventional solid mechanics' theory. The electromigration (EM) effect is thus suggested to be a local stress relaxation at the condition beyond the critical point. In this study, in situ current stressing experiment with synchrotron radiation-based XRD and in situ SEM equipped with EBSD system were employed to investigate the electric current-induced plastic deformation. The results revealed that at a relatively higher level of current density and the corresponding lattice strain, twinning accompanied with the voids/hillocks formation would be found. When slightly decreasing the current density, no twinning but only voids/hillocks formation could be found. The authors hope this study will advance the knowledge of electric current-induced plastic deformation and provide a further guideline for EM-resistant materials.

Original languageEnglish
Title of host publication2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages197-198
Number of pages2
ISBN (Electronic)9784990218850
DOIs
Publication statusPublished - 2018 Jun 6
Event2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018 - Kuwana, Mie, Japan
Duration: 2018 Apr 172018 Apr 21

Publication series

Name2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018

Other

Other2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018
CountryJapan
CityKuwana, Mie
Period18-04-1718-04-21

Fingerprint

Electric currents
Plastic deformation
Electromigration
Twinning
Current density
Stress relaxation
Synchrotron radiation
Crystal lattices
Mechanics
Scanning electron microscopy
Electrons
Experiments

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Polymers and Plastics

Cite this

Liu, Y. C., & Lin, S. (2018). Electric current-induced plastic deformation: An in situ experimental study. In 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018 (pp. 197-198). (2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/ICEP.2018.8374702
Liu, Yu Chen ; Lin, Shih-kang. / Electric current-induced plastic deformation : An in situ experimental study. 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 197-198 (2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018).
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Liu, YC & Lin, S 2018, Electric current-induced plastic deformation: An in situ experimental study. in 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018. 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018, Institute of Electrical and Electronics Engineers Inc., pp. 197-198, 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018, Kuwana, Mie, Japan, 18-04-17. https://doi.org/10.23919/ICEP.2018.8374702

Electric current-induced plastic deformation : An in situ experimental study. / Liu, Yu Chen; Lin, Shih-kang.

2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 197-198 (2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Liu YC, Lin S. Electric current-induced plastic deformation: An in situ experimental study. In 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 197-198. (2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018). https://doi.org/10.23919/ICEP.2018.8374702