Electric field-induced structural changes in pentacene-based organic thin-film transistors studied by in situ micro-Raman spectroscopy

H. L. Cheng; W. Y. Chou; C. W. Kuo; F. C. Tang; Y. W. Wang

doi:10.1063/1.2197937

Electric field-induced structural changes in pentacene-based organic thin-film transistors studied by in situ micro-Raman spectroscopy

H. L. Cheng, W. Y. Chou, C. W. Kuo, F. C. Tang, Y. W. Wang

Research output: Contribution to journal › Article

41 Citations (Scopus)

Abstract

We have investigated the electric field-induced microscopic structural changes in polycrystalline pentacene-based organic transistors by using in situ micro-Raman spectroscopy. Extra vibrational modes resulting from molecular coupling effect in pentacene film were studied. The herringbone packing of pentacene molecules in solid film is affected by external field and the process is proven to be partially irreversible. In the meantime, in-phase coupling of the C-H bending mode was found to be highly related to the carrier transport of pentacene film. Obtained results suggest that optimal intermolecular π -orbital overlap of pentacene molecules is still a critical factor impacting the carrier transportation for pentacene film featuring polycrystalline morphology.

Original language	English
Article number	161918
Journal	Applied Physics Letters
Volume	88
Issue number	16
DOIs	https://doi.org/10.1063/1.2197937
Publication status	Published - 2006 Apr 17

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.2197937

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Cheng, H. L., Chou, W. Y., Kuo, C. W., Tang, F. C., & Wang, Y. W. (2006). Electric field-induced structural changes in pentacene-based organic thin-film transistors studied by in situ micro-Raman spectroscopy. Applied Physics Letters, 88(16), [161918]. https://doi.org/10.1063/1.2197937

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