A zinc oxide (ZnO) nanowire (NW) photodetector was fabricated with a simple method by bridging the gap of interdigitated gallium-doped ZnO pattern deposited on a silicon oxide ( SiO2) thin film with interlaced ZnO NWs. With an incident wavelength of 375 nm, it was found that measured responsivity was 0.055A/W for the interlaced ZnO NWs photodetector with a 1 V applied bias. The transient time constants measured during the turn-on and turn-off states were τON = 12.72 ms and τOFF=447. 66 ms, respectively. Furthermore, the low-frequency noise spectra obtained from the ultraviolet photodetector were purely due to the f noise. Besides, the noise equivalent power and normalized detectivity (D) of the ZnO NW photodetector were 2.32 ×10-9W and 7.43 ×109cm cdotHz0.5W-1, respectively.
|Number of pages||6|
|Journal||IEEE Journal on Selected Topics in Quantum Electronics|
|Publication status||Published - 2011 Jul 1|
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering