Electrical properties of multiple high-dose Si implantation in p-GaN

Wei Chih Lai, Mesio Yokoyama, Chiung Chi Tsai, Chen Shiung Chang, Jan Dar Guo, Jian Shihn Tsang, Shih Hsiung Chan, Chun Yen Chang

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

This work performs Si ion implantation the electrical conductive type of the p-GaN film from p-type to n-type. Multiple implantation method is also used to form a uniform Si implanted region in the p-type GaN epitaxial layer. Implant energies for the multiple implantation are 40, 100, and 200 KeV. The implant dose is 5×1015 cm-2 for each implant energy. After implantation, the samples are annealed in a N2 ambient for different annealing temperatures and annealing times. The activation efficiency reaches as high as 20% when annealing the sample at 1000 °C. The carrier activation energy is about 720 meV. The low activation energy indicates that the hopping process mechanism is the dominant mechanism for the activation of the Si implantation in p-GaN. Moreover, the rectifying I-V characteristic of the p-n GaN diode is also examined.

Original languageEnglish
Pages (from-to)L802-L804
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume38
Issue number7 B
DOIs
Publication statusPublished - 1999

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Electrical properties of multiple high-dose Si implantation in p-GaN'. Together they form a unique fingerprint.

Cite this