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Electrical Stress and Total Ionizing Dose Effects on Graphene-Based NonVolatile Memory Devices
Cher Xuan Zhang, En Xia Zhang, Daniel M. Fleetwood, Michael L. Alles, Ronald D. Schrimpf, Emil B. Song, Sung Min Kim, Kang L. Wang, Kosmas Galatsis
Research output: Contribution to journal › Article › peer-review
18
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(Scopus)