Electronic structure of chromium-containing amorphous hydrogenated carbon thin films studied by X-ray absorption spectroscopy

Hsin Yen Cheng, Jau Wern Chiou, Jyh-Ming Ting, Jin Ming Chen, Jyh Fu Lee, Yon-Hua Tzeng

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

C K-, Cr L 3.2 -, and K-edge X-ray absorption near-edge structure (XANES) analysis, high-resolution transmission electron microscopy examination, and optical absorptance have been examined to obtain a correlation between the optical absorptance and electronic structure of chromium-containing amorphous hydrogenated carbon thin films (a-C:H/Cr) deposited using a dc magnetron sputter deposition technique. It was found that the C 2pCr 3d hybridization gradually increases as the Cr nanoparticle (NP) size decreases, accompanied by a C 2p interband transition. The amount of CH bonding and the change in crystalline structure are the main factors affecting the optical absorptance of the thin films. The size of the Cr NP affects the absorption wavelength range of the films. The optical absorptance and C K-edge XANES spectra indicate that a decrease in the size of Cr NP raises the conduction-band-minimum and may also increase the bandgap.

Original languageEnglish
Pages (from-to)202-206
Number of pages5
JournalApplied Surface Science
Volume264
DOIs
Publication statusPublished - 2013 Jan 1

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X ray absorption spectroscopy
Carbon films
Chromium
Electronic structure
X ray absorption
Nanoparticles
Thin films
Sputter deposition
High resolution transmission electron microscopy
Conduction bands
Energy gap
Crystalline materials
Wavelength

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

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title = "Electronic structure of chromium-containing amorphous hydrogenated carbon thin films studied by X-ray absorption spectroscopy",
abstract = "C K-, Cr L 3.2 -, and K-edge X-ray absorption near-edge structure (XANES) analysis, high-resolution transmission electron microscopy examination, and optical absorptance have been examined to obtain a correlation between the optical absorptance and electronic structure of chromium-containing amorphous hydrogenated carbon thin films (a-C:H/Cr) deposited using a dc magnetron sputter deposition technique. It was found that the C 2pCr 3d hybridization gradually increases as the Cr nanoparticle (NP) size decreases, accompanied by a C 2p interband transition. The amount of CH bonding and the change in crystalline structure are the main factors affecting the optical absorptance of the thin films. The size of the Cr NP affects the absorption wavelength range of the films. The optical absorptance and C K-edge XANES spectra indicate that a decrease in the size of Cr NP raises the conduction-band-minimum and may also increase the bandgap.",
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Electronic structure of chromium-containing amorphous hydrogenated carbon thin films studied by X-ray absorption spectroscopy. / Cheng, Hsin Yen; Chiou, Jau Wern; Ting, Jyh-Ming; Chen, Jin Ming; Lee, Jyh Fu; Tzeng, Yon-Hua.

In: Applied Surface Science, Vol. 264, 01.01.2013, p. 202-206.

Research output: Contribution to journalArticle

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