Electronic structure of ZnO nanorods studied by angle-dependent X-ray absorption spectroscopy and scanning photoelectron microscopy

J. W. Chiou, J. C. Jan, H. M. Tsai, C. W. Bao, W. F. Pong, M. H. Tsai, I. H. Hong, R. Klauser, J. F. Lee, J. J. Wu, S. C. Liu

Research output: Contribution to journalArticlepeer-review

102 Citations (Scopus)

Abstract

The electronic structure of ZnO nanorods was studied to differentiate local electronic structures at the tips and sidewalls. The overall intensity of the O K-edge x ray absorption near edge structure (XANES) spectra was found to be greatly enhanced for small proton incident angles. Substantial enhancements of O 2p derived states was also shown by both valence band photoemission and O Kedge XANES near the valence band maximum and conduction band minimum respectively. The analysis showed suggested that the tip surfaces of the highly aligned ZnO nanorods were terminated by O ions.

Original languageEnglish
Pages (from-to)3462-3464
Number of pages3
JournalApplied Physics Letters
Volume84
Issue number18
DOIs
Publication statusPublished - 2004 May 3

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Electronic structure of ZnO nanorods studied by angle-dependent X-ray absorption spectroscopy and scanning photoelectron microscopy'. Together they form a unique fingerprint.

Cite this