Embedded memory diagnostic data compression using differential address

Chin Lung Su, Rei Fu Huang, Cheng Wen Wu, Yeong Jar Chang, Shen Tien Lin, Wen Ching Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

Embedded memory diagnostics is normally done by the built-in self-diagnosis (BISD) hardware, which collects and sends the diagnostic data to the external tester. The cost of the diagnosis process highly depends on the data volumn sent between the chip under test and the tester, since the transmission time and the tester capture memory are major cost factors. We propose a memory BISD design using differential addressing, as well as a method for evaluating and choosing a proper differential address level. Based on our previous work on pattern identification BISD and syndrome compression design, the proposed differential address compression scheme further reduces the diagnostic data volumn. Experimental results show that the BISD design is cost-effective.

Original languageEnglish
Title of host publication2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Pages20-23
Number of pages4
DOIs
Publication statusPublished - 2005 Dec 1
Event2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) - Hsinchu, Taiwan
Duration: 2005 Apr 272005 Apr 29

Publication series

Name2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Volume2005

Other

Other2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Country/TerritoryTaiwan
CityHsinchu
Period05-04-2705-04-29

All Science Journal Classification (ASJC) codes

  • General Engineering

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