Empirical Study of Proposed Meltdown Attack Implementation on BOOM v3

Chien Hsiang Lin, Yi Pei Su, Yean Ru Chen, Yu Ting Chou, Sao Jie Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In recent years, the discovery of transient attacks such as Spectre and Meltdown has brought a huge impact on many processor manufacturers. Therefore, these manufacturers must pay more attention to the security verification of their products and understand the principles of these transient attacks in order to avoid developing products with security vulnerabilities. The Meltdown attack exploits the hardware vulnerability of permission checking and the out-of-order execution feature that is implemented on modern processors, thereby leaking some protected important data. In this paper, we provide a sample code of Meltdown attack to show the open source RISC-V processor-BOOM v3 (Berkeley Out-of-Order Machine) which is claimed to have mitigation mechanism for Meltdown attack is still vulnerable. We also analyze the implementation of BOOM's permission check and the features of out-of-order to illustrate why our sample attack can attack it successfully. According to our experimental results, the simulation time of this code costs 3.9 ms to show that BOOM v3 will be affected by Meltdown attack.

Original languageEnglish
Title of host publicationMWSCAS 2022 - 65th IEEE International Midwest Symposium on Circuits and Systems, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665402798
DOIs
Publication statusPublished - 2022
Event65th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2022 - Fukuoka, Japan
Duration: 2022 Aug 72022 Aug 10

Publication series

NameMidwest Symposium on Circuits and Systems
Volume2022-August
ISSN (Print)1548-3746

Conference

Conference65th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2022
Country/TerritoryJapan
CityFukuoka
Period22-08-0722-08-10

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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