Energy band structure tailoring of InGaAsP/InGaAs quantum well prepared by organometallic vapor phase epitaxy and measured by photoluminescence

  • Wei Lin
  • , Hung Pin Shiao
  • , Chwan Yang Chang
  • , Tian Tsorng Shi
  • , Ching Ting Lee
  • , Yuan Kuang Tu

Research output: Contribution to conferencePaperpeer-review

Abstract

We report the theoretical and experimental results of the InxGa1-xASyP1-y/InzGa1-zAs quantum wells (QW). Wafers prepared by low-pressure organometallic vapor ph ase epitaxy (OMVPE) were studied. The band offset ratios at the heterointerface and material's energy bandgap are determined from the model-solid theory of Van de Walle, while single partical model is used to solve the Schrodinger equation to predict the corresponding wavelength. For unstrained InxGa1-xASyP1-y/In0.53Ga0.47As quantum wells, the conduction band offset of bandgap difference (dEc%) can be formulated as: (dEc%)unstrained = 42.6% - (25.4y)%; on the other hand, for strained InxGa1-xAsyP1-y/InzGa1-zAs quantum wells, the strain (S) changes the dEc% as: (dEc%)strain=(dEc%)unstrained +1.3·S. Results of our samples, measured by photoluminescence and transmission electron microscopy measurements, demonstrate good agreements in devised unstrained QW structure with theoretical calculations.

Original languageEnglish
DOIs
Publication statusPublished - 1994
Event1994 International Electron Devices and Materials Symposium, EDMS 1994 - Hsinchu, Taiwan
Duration: 1994 Jul 121994 Jul 15

Conference

Conference1994 International Electron Devices and Materials Symposium, EDMS 1994
Country/TerritoryTaiwan
CityHsinchu
Period94-07-1294-07-15

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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