TY - GEN
T1 - Energy-efficient architecture for word-based Montgomery modular multiplication algorithm
AU - Ye, Jheng Hao
AU - Hung, Tsung Wei
AU - Shieh, Ming Der
PY - 2013/8/15
Y1 - 2013/8/15
N2 - Montgomery modular multiplication is widely used in public key cryptosystems. This paper presents an energy-efficient architecture for word-based Montgomery modular multiplication algorithm. Using the proposed architecture mapping scheme in dependency graph, the switching activity of kernel can be greatly reduced. In addition, the proposed design also retains one-cycle latency between neighboring processing elements. Experimental results based on TSMC 90-nm CMOS technology show that compared to the related work, the proposed design achieves about 17% reduction in energy consumption for completing one 1024-bit Montgomery modular multiplication.
AB - Montgomery modular multiplication is widely used in public key cryptosystems. This paper presents an energy-efficient architecture for word-based Montgomery modular multiplication algorithm. Using the proposed architecture mapping scheme in dependency graph, the switching activity of kernel can be greatly reduced. In addition, the proposed design also retains one-cycle latency between neighboring processing elements. Experimental results based on TSMC 90-nm CMOS technology show that compared to the related work, the proposed design achieves about 17% reduction in energy consumption for completing one 1024-bit Montgomery modular multiplication.
UR - http://www.scopus.com/inward/record.url?scp=84881335099&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84881335099&partnerID=8YFLogxK
U2 - 10.1109/VLDI-DAT.2013.6533882
DO - 10.1109/VLDI-DAT.2013.6533882
M3 - Conference contribution
AN - SCOPUS:84881335099
SN - 9781467344357
T3 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
BT - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
T2 - 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013
Y2 - 22 April 2013 through 24 April 2013
ER -