TY - JOUR
T1 - Engineering chain
T2 - A novel semiconductor engineering collaboration model
AU - Cheng, Fan Tien
AU - Chen, Ying Liang
AU - Chang, Jonathan Yung Cheng
N1 - Funding Information:
Manuscript received January 16, 2010; revised August 19, 2011 and January 21, 2012; accepted March 9, 2012. Date of publication March 21, 2012; date of current version July 31, 2012. This work was supported by the National Science Council (NSC) of the Republic of China, under Contract NSC-100-2221-E-006-002, and by the Ministry of Education of the Republic of China, under Contract MOE100 (AIM-HI). Portions of this paper were presented in the 2007 IEEE International Conference on Robotics and Automation, Rome, Italy, in April 2007, pp. 1597–1602.
PY - 2012
Y1 - 2012
N2 - As an integrated circuit (IC) design house adopts a new semiconductor manufacturing technology for a new IC design, the failure rate and design cycle of the new technology are much higher than those of the mature technologies. Consequently, shortening the IC design cycle of a new technology becomes more difficult since a design house needs to finish the design with more complicated processes in a shorter cycle time. IC suppliers will lose their competition and market if they cannot cut the cycle time from IC design to IC mass-production. This paper proposes a novel engineering-chain (EC) collaboration model to formulate this high-IC-design-failure-rate and long-IC-design-cycle problem. The goals of EC are improving IC-design success rate, reducing cycle time, and increasing revenue. This paper also proposes an engineering chain management system (ECMS) to help achieve the goals of EC. In order to accommodate the EC requirements, it is required to extend the existing computer-integrated- manufacturing scope of a foundry from single-factor operating control to cross-industry operating control. This paper applies the concept of framework to design the ECMS and adopts the new-generation interoperable document-centric computing technology, webservices, as the enabling technology for the communication interface of the ECMS framework. All of the EC-related concepts and requirements are well established in this paper and the ECMS is a linkage of these concepts into a single business process to achieve the EC goals.
AB - As an integrated circuit (IC) design house adopts a new semiconductor manufacturing technology for a new IC design, the failure rate and design cycle of the new technology are much higher than those of the mature technologies. Consequently, shortening the IC design cycle of a new technology becomes more difficult since a design house needs to finish the design with more complicated processes in a shorter cycle time. IC suppliers will lose their competition and market if they cannot cut the cycle time from IC design to IC mass-production. This paper proposes a novel engineering-chain (EC) collaboration model to formulate this high-IC-design-failure-rate and long-IC-design-cycle problem. The goals of EC are improving IC-design success rate, reducing cycle time, and increasing revenue. This paper also proposes an engineering chain management system (ECMS) to help achieve the goals of EC. In order to accommodate the EC requirements, it is required to extend the existing computer-integrated- manufacturing scope of a foundry from single-factor operating control to cross-industry operating control. This paper applies the concept of framework to design the ECMS and adopts the new-generation interoperable document-centric computing technology, webservices, as the enabling technology for the communication interface of the ECMS framework. All of the EC-related concepts and requirements are well established in this paper and the ECMS is a linkage of these concepts into a single business process to achieve the EC goals.
UR - https://www.scopus.com/pages/publications/84864675951
UR - https://www.scopus.com/pages/publications/84864675951#tab=citedBy
U2 - 10.1109/TSM.2012.2191626
DO - 10.1109/TSM.2012.2191626
M3 - Article
AN - SCOPUS:84864675951
SN - 0894-6507
VL - 25
SP - 394
EP - 407
JO - IEEE Transactions on Semiconductor Manufacturing
JF - IEEE Transactions on Semiconductor Manufacturing
IS - 3
M1 - 6117097
ER -