Enhanced hot-carrier induced degradation in pMOSFETs stressed under high gate voltage

Jone-Fang Chen, Chih Pin Tsao, T. C. Ong

Research output: Contribution to journalConference articlepeer-review

Fingerprint

Dive into the research topics of 'Enhanced hot-carrier induced degradation in pMOSFETs stressed under high gate voltage'. Together they form a unique fingerprint.

Engineering & Materials Science