Enhancement of CMOSFETs performance by utilizing SACVD-based shallow trench isolation for the 40-nm node and beyond

Yao Tsung Huang, San Lein Wu, Shoou Jinn Chang, Chin Kai Hung, Tzu Juei Wang, Cheng Wen Kuo, Cheng Tung Huang, Osbert Cheng

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Enhancement of CMOSFETs performance by utilizing SACVD-based shallow trench isolation for the 40-nm node and beyond'. Together they form a unique fingerprint.

Engineering & Materials Science