Enhancing testability of VLSI arrays for fast Fourier transform

S.-K. Lu, S.-Y. Kuo, Cheng-Wen Wu

Research output: Contribution to journalArticle

16 Citations (Scopus)
Original languageEnglish
Pages (from-to)161-166
JournalIEE Proceedings Pt. E
Volume140
Issue number3
Publication statusPublished - 1993 May

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