| Original language | English |
|---|---|
| Pages (from-to) | 161-166 |
| Journal | IEE Proceedings Pt. E |
| Volume | 140 |
| Issue number | 3 |
| Publication status | Published - 1993 May |
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Enhancing testability of VLSI arrays for fast Fourier transform
- S.-K. Lu
- , S.-Y. Kuo
- , Cheng-Wen Wu
Research output: Contribution to journal › Article › peer-review
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