Enhancing the electroluminescence efficiency of Si NC/SiO2 superlattice-based light-emitting diodes through hydrogen ion beam treatment

Sheng Wen Fu, Hui Ju Chen, Hsuan Ta Wu, Shao Ping Chen, Chuan Feng Shih

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

This paper presents a novel method for enhancing the electroluminescence (EL) efficiency of ten-period silicon-rich oxide (SRO)/SiO2 superlattice-based light-emitting diodes (LEDs). A hydrogen ion beam (HIB) was used to irradiate each SRO layer of the superlattices to increase the interfacial roughness on the nanoscale and the density of the Si nanocrystals (Si NCs). Fowler-Nordheim (F-N) tunneling was the major mechanism for injecting the carriers into the Si NCs. The barrier height of the F-N tunneling was lowered by forming a nano-roughened interface and the nonradiative Pb centers were passivated through the HIB treatment. Additionally, the reflectance of the LEDs was lowered because of the nano-roughened interface. These factors considerably increased the slope efficiency of EL and the maximum output power of the LEDs. The lighting efficiency increased by an order of magnitude, and the turn-on voltage decreased considerably. This study established an efficient approach for obtaining bright Si NC/SiO2 superlattice-based LEDs.

Original languageEnglish
Pages (from-to)7155-7162
Number of pages8
JournalNanoscale
Volume8
Issue number13
DOIs
Publication statusPublished - 2016 Apr 7

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

Fingerprint Dive into the research topics of 'Enhancing the electroluminescence efficiency of Si NC/SiO<sub>2</sub> superlattice-based light-emitting diodes through hydrogen ion beam treatment'. Together they form a unique fingerprint.

Cite this