Ferroelectric Ba(1-x)SrxTiO3 (x = 0.5 and 0.25) thin films were grown on (001) LaAlO3 by using pulsed laser ablation. Extensive x-ray diffraction and selected area electron diffraction reveal that the as-grown films were (001) oriented with a good in-plane relationship of 〈100〉BSTO // lang;100〉LAO- Rutherford Backscattering Spectroscopy ion-channeling studies suggested that the films had excellent epitaxial quality and crystallinity with an ion beam minimum yield χmin of only 2.6%. Atomically sharp interfaces were seen by cross-sectional high-resolution electron microscopy, indicated that the density of misfit dislocations was consistent with the lattice mismatch from the theoretical calculation.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Ceramics and Composites
- Materials Chemistry
- Electrical and Electronic Engineering
- Control and Systems Engineering