Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon

Wen I. Liang, Chun Yen Peng, Rong Huang, Wei Cheng Kuo, Yen Chin Huang, Carolina Adamo, Yi Chun Chen, Li Chang, Jenh Yih Juang, Darrel G. Schlom, Ying Hao Chu

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.

Original languageEnglish
Pages (from-to)1322-1326
Number of pages5
Issue number3
Publication statusPublished - 2016 Jan 21

All Science Journal Classification (ASJC) codes

  • General Materials Science


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