Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon

Wen I. Liang, Chun Yen Peng, Rong Huang, Wei Cheng Kuo, Yen Chin Huang, Carolina Adamo, Yi Chun Chen, Li Chang, Jenh Yih Juang, Darrel G. Schlom, Ying Hao Chu

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.

Original languageEnglish
Pages (from-to)1322-1326
Number of pages5
JournalNanoscale
Volume8
Issue number3
DOIs
Publication statusPublished - 2016 Jan 21

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Phase boundaries
Silicon
Ferroelectricity
Ferromagnetism
Substrates

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

Cite this

Liang, W. I., Peng, C. Y., Huang, R., Kuo, W. C., Huang, Y. C., Adamo, C., ... Chu, Y. H. (2016). Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon. Nanoscale, 8(3), 1322-1326. https://doi.org/10.1039/c5nr07033c
Liang, Wen I. ; Peng, Chun Yen ; Huang, Rong ; Kuo, Wei Cheng ; Huang, Yen Chin ; Adamo, Carolina ; Chen, Yi Chun ; Chang, Li ; Juang, Jenh Yih ; Schlom, Darrel G. ; Chu, Ying Hao. / Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon. In: Nanoscale. 2016 ; Vol. 8, No. 3. pp. 1322-1326.
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Liang, WI, Peng, CY, Huang, R, Kuo, WC, Huang, YC, Adamo, C, Chen, YC, Chang, L, Juang, JY, Schlom, DG & Chu, YH 2016, 'Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon', Nanoscale, vol. 8, no. 3, pp. 1322-1326. https://doi.org/10.1039/c5nr07033c

Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon. / Liang, Wen I.; Peng, Chun Yen; Huang, Rong; Kuo, Wei Cheng; Huang, Yen Chin; Adamo, Carolina; Chen, Yi Chun; Chang, Li; Juang, Jenh Yih; Schlom, Darrel G.; Chu, Ying Hao.

In: Nanoscale, Vol. 8, No. 3, 21.01.2016, p. 1322-1326.

Research output: Contribution to journalArticle

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AU - Huang, Yen Chin

AU - Adamo, Carolina

AU - Chen, Yi Chun

AU - Chang, Li

AU - Juang, Jenh Yih

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AU - Chu, Ying Hao

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AB - The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.

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Liang WI, Peng CY, Huang R, Kuo WC, Huang YC, Adamo C et al. Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon. Nanoscale. 2016 Jan 21;8(3):1322-1326. https://doi.org/10.1039/c5nr07033c