Original language | English |
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Title of host publication | The 27th International Conference on Flexible Automation and Intelligent Manufacturing (FAIM2017) |
Place of Publication | Modena, Italy |
Publication status | Published - 2017 |
Equipment Health Monitoring in the Semiconductor Assembly Process.
Dong Zhao-Hong, Jang Bo-Kai, Chia-Yen Lee
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution