Error comparison for different current patterns in electrical impedance imaging

Kuo sheng Cheng, D. Isaacson, J. C. Newell, D. G. Gisser

Research output: Contribution to conferencePaperpeer-review

3 Citations (Scopus)

Abstract

Different current patterns used in electric-current computed tomography (ECCT) were compared for their sensitivity to noise. This comparison was made by examining the error produced in reconstructing one voltage pattern from measurements made using another. It was found that the adjacent-pair current pattern is more sensitive to noise than spatial trigonometric current patterns. The measured spatial trigonometric voltage patterns were not degraded when a simulated electrode contact impedance was introduced.

Original languageEnglish
Pages279-280
Number of pages2
Publication statusPublished - 1988 Nov 1
EventProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society - New Orleans, LA, USA
Duration: 1988 Nov 41988 Nov 7

Other

OtherProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society
CityNew Orleans, LA, USA
Period88-11-0488-11-07

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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