Error comparison for different current patterns in electrical impedance imaging

Kuo-Sheng Cheng, D. Isaacson, J. C. Newell, D. G. Gisser

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Different current patterns used in electric-current computed tomography (ECCT) were compared for their sensitivity to noise. This comparison was made by examining the error produced in reconstructing one voltage pattern from measurements made using another. It was found that the adjacent-pair current pattern is more sensitive to noise than spatial trigonometric current patterns. The measured spatial trigonometric voltage patterns were not degraded when a simulated electrode contact impedance was introduced.

Original languageEnglish
Title of host publicationIEEE/Engineering in Medicine and Biology Society Annual Conference
PublisherPubl by IEEE
Pages279-280
Number of pages2
Volume10
Editionpt 1
Publication statusPublished - 1988 Nov
EventProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society - New Orleans, LA, USA
Duration: 1988 Nov 41988 Nov 7

Other

OtherProceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society
CityNew Orleans, LA, USA
Period88-11-0488-11-07

Fingerprint

Acoustic impedance
Imaging techniques
Electric potential
Electric currents
Tomography
Electrodes

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Cheng, K-S., Isaacson, D., Newell, J. C., & Gisser, D. G. (1988). Error comparison for different current patterns in electrical impedance imaging. In IEEE/Engineering in Medicine and Biology Society Annual Conference (pt 1 ed., Vol. 10, pp. 279-280). Publ by IEEE.
Cheng, Kuo-Sheng ; Isaacson, D. ; Newell, J. C. ; Gisser, D. G. / Error comparison for different current patterns in electrical impedance imaging. IEEE/Engineering in Medicine and Biology Society Annual Conference. Vol. 10 pt 1. ed. Publ by IEEE, 1988. pp. 279-280
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Cheng, K-S, Isaacson, D, Newell, JC & Gisser, DG 1988, Error comparison for different current patterns in electrical impedance imaging. in IEEE/Engineering in Medicine and Biology Society Annual Conference. pt 1 edn, vol. 10, Publ by IEEE, pp. 279-280, Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, New Orleans, LA, USA, 88-11-04.

Error comparison for different current patterns in electrical impedance imaging. / Cheng, Kuo-Sheng; Isaacson, D.; Newell, J. C.; Gisser, D. G.

IEEE/Engineering in Medicine and Biology Society Annual Conference. Vol. 10 pt 1. ed. Publ by IEEE, 1988. p. 279-280.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Cheng K-S, Isaacson D, Newell JC, Gisser DG. Error comparison for different current patterns in electrical impedance imaging. In IEEE/Engineering in Medicine and Biology Society Annual Conference. pt 1 ed. Vol. 10. Publ by IEEE. 1988. p. 279-280