Error signal artifact in apertureless scanning near-field optical microscopy

L. Billot; M. Lamy De La Chapelle; D. Barchiesi; S. H. Chang; S. K. Gray; J. A. Rogers; A. Bouhelier; P. M. Adam; J. L. Bijeon; G. P. Wiederrecht; R. Bachelot; P. Royer

doi:10.1063/1.2219134

Error signal artifact in apertureless scanning near-field optical microscopy

L. Billot, M. Lamy De La Chapelle, D. Barchiesi, S. H. Chang, S. K. Gray, J. A. Rogers, A. Bouhelier, P. M. Adam, J. L. Bijeon, G. P. Wiederrecht, R. Bachelot, P. Royer

Department of Photonics

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

Apertureless scanning near-field optical microscopy is a method for obtaining subwavelength optical images of nanostructures. However, great care must be taken to avoid artifactual images. We report on one artifact related to the error signal in cantilever vibration amplitude when operating in tapping mode atomic force microscopy. The artifact is described experimentally and modeled by electromagnetic calculations based on the finite element method. We report specific steps to identify and avoid this artifact with experimental results on gold nanostructures. It is suggested that future apertureless scanning near-field optical microscopy studies verify that optical image does not correlate with error signal.

Original language	English
Article number	023105
Journal	Applied Physics Letters
Volume	89
Issue number	2
DOIs	https://doi.org/10.1063/1.2219134
Publication status	Published - 2006

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.2219134

Cite this

@article{fdbb56c5c3ff4f3d9dc01706eaac5054,

title = "Error signal artifact in apertureless scanning near-field optical microscopy",

abstract = "Apertureless scanning near-field optical microscopy is a method for obtaining subwavelength optical images of nanostructures. However, great care must be taken to avoid artifactual images. We report on one artifact related to the error signal in cantilever vibration amplitude when operating in tapping mode atomic force microscopy. The artifact is described experimentally and modeled by electromagnetic calculations based on the finite element method. We report specific steps to identify and avoid this artifact with experimental results on gold nanostructures. It is suggested that future apertureless scanning near-field optical microscopy studies verify that optical image does not correlate with error signal.",

author = "L. Billot and {De La Chapelle}, {M. Lamy} and D. Barchiesi and Chang, {S. H.} and Gray, {S. K.} and Rogers, {J. A.} and A. Bouhelier and Adam, {P. M.} and Bijeon, {J. L.} and Wiederrecht, {G. P.} and R. Bachelot and P. Royer",

note = "Funding Information: The authors at UTT acknowledge the Conseil R{\'e}gional de Champagne-Ardennes and the European Social Funds for financial support. The work at Argonne was supported by the U.S. Department of Energy, Basic Energy Sciences, Materials Science Division under Contract No. W-31-109-ENG-38.",

year = "2006",

doi = "10.1063/1.2219134",

language = "English",

volume = "89",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "2",

}

TY - JOUR

T1 - Error signal artifact in apertureless scanning near-field optical microscopy

AU - Billot, L.

AU - De La Chapelle, M. Lamy

AU - Barchiesi, D.

AU - Chang, S. H.

AU - Gray, S. K.

AU - Rogers, J. A.

AU - Bouhelier, A.

AU - Adam, P. M.

AU - Bijeon, J. L.

AU - Wiederrecht, G. P.

AU - Bachelot, R.

AU - Royer, P.

N1 - Funding Information: The authors at UTT acknowledge the Conseil Régional de Champagne-Ardennes and the European Social Funds for financial support. The work at Argonne was supported by the U.S. Department of Energy, Basic Energy Sciences, Materials Science Division under Contract No. W-31-109-ENG-38.

PY - 2006

Y1 - 2006

N2 - Apertureless scanning near-field optical microscopy is a method for obtaining subwavelength optical images of nanostructures. However, great care must be taken to avoid artifactual images. We report on one artifact related to the error signal in cantilever vibration amplitude when operating in tapping mode atomic force microscopy. The artifact is described experimentally and modeled by electromagnetic calculations based on the finite element method. We report specific steps to identify and avoid this artifact with experimental results on gold nanostructures. It is suggested that future apertureless scanning near-field optical microscopy studies verify that optical image does not correlate with error signal.

AB - Apertureless scanning near-field optical microscopy is a method for obtaining subwavelength optical images of nanostructures. However, great care must be taken to avoid artifactual images. We report on one artifact related to the error signal in cantilever vibration amplitude when operating in tapping mode atomic force microscopy. The artifact is described experimentally and modeled by electromagnetic calculations based on the finite element method. We report specific steps to identify and avoid this artifact with experimental results on gold nanostructures. It is suggested that future apertureless scanning near-field optical microscopy studies verify that optical image does not correlate with error signal.

UR - http://www.scopus.com/inward/record.url?scp=33746035682&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33746035682&partnerID=8YFLogxK

U2 - 10.1063/1.2219134

DO - 10.1063/1.2219134

M3 - Article

AN - SCOPUS:33746035682

SN - 0003-6951

VL - 89

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 2

M1 - 023105

ER -

Error signal artifact in apertureless scanning near-field optical microscopy

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