TY - JOUR
T1 - Estimating the absorptivity in laser processing by inverse methodology
AU - Chen, Wen Lih
AU - Yang, Yu Ching
AU - Lee, Haw Long
N1 - Funding Information:
This work was supported by the National Science Council, Taiwan, Republic of China, under the Grant No. NSC 94-2212-E-168-014.
Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2007/7/1
Y1 - 2007/7/1
N2 - In the present study, a conjugate gradient method is applied to estimate the unknown time-dependent laser absorptivity during a laser processing, based on available temperature measurements. It is assumed that no prior information is available for the functional form of the unknown absorptivity. But depending on the temperature history at a measuring position, the unknown time-dependent absorptivity can be estimated by an inverse analysis. The accuracy of the current method is examined by using the simulated exact and inexact temperature measurements. Results show that excellent agreement on the absorptivity can be obtained for all the test cases considered in this study. Subsequently, accurate melting depth and temperature distributions can also be returned. The methodology presented here can also be applied to other various applications, such as calculating the cutting forces in nanomachining by atomic force microscopy (AFM), and estimating the heat sources in a X-ray lithographic process.
AB - In the present study, a conjugate gradient method is applied to estimate the unknown time-dependent laser absorptivity during a laser processing, based on available temperature measurements. It is assumed that no prior information is available for the functional form of the unknown absorptivity. But depending on the temperature history at a measuring position, the unknown time-dependent absorptivity can be estimated by an inverse analysis. The accuracy of the current method is examined by using the simulated exact and inexact temperature measurements. Results show that excellent agreement on the absorptivity can be obtained for all the test cases considered in this study. Subsequently, accurate melting depth and temperature distributions can also be returned. The methodology presented here can also be applied to other various applications, such as calculating the cutting forces in nanomachining by atomic force microscopy (AFM), and estimating the heat sources in a X-ray lithographic process.
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U2 - 10.1016/j.amc.2007.01.077
DO - 10.1016/j.amc.2007.01.077
M3 - Article
AN - SCOPUS:34249819972
SN - 0096-3003
VL - 190
SP - 712
EP - 721
JO - Applied Mathematics and Computation
JF - Applied Mathematics and Computation
IS - 1
ER -