Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels

Fong Jyun Tsai, Chong Siao Ye, Yu Huang, Kuen Jong Lee, Wu Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Shi Xuan Zheng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Over the past two decades, test data compression has become a de facto technology used in large industrial designs to reduce the overall test cost. During DFT planning, it is very important to understand the impact of using different numbers of input/output channels on test coverage, test cycles, and test data volume. In this paper, an efficient method to estimate the test data volume with different input channel counts using the Embedded Deterministic Test (EDT) compression technology is proposed. The results can then be used to quickly determine the scan configuration that results in the least or near least test data volume. With this method, the total ATPG run time can be reduced by a factor of more than 10X compared to the currently used trial-and-error method.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages130-135
Number of pages6
ISBN (Electronic)9781728189444
DOIs
Publication statusPublished - 2020 Sep
Event4th IEEE International Test Conference in Asia, ITC-Asia 2020 - Taipei, Taiwan
Duration: 2020 Sep 232020 Sep 25

Publication series

NameProceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020

Conference

Conference4th IEEE International Test Conference in Asia, ITC-Asia 2020
CountryTaiwan
CityTaipei
Period20-09-2320-09-25

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Hardware and Architecture
  • Information Systems and Management
  • Safety, Risk, Reliability and Quality

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