Evanescent microwave probe study on dielectric properties of materials

Hsiu Fung Cheng, Yi-Chun Chen, I. Nan Lin

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution.

Original languageEnglish
Pages (from-to)1801-1805
Number of pages5
JournalJournal of the European Ceramic Society
Volume26
Issue number10-11
DOIs
Publication statusPublished - 2006 Apr 11

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Dielectric properties
Microwaves
Resonators
Cavity resonators
Electromagnetic fields
Imaging techniques

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites

Cite this

@article{974a2d33cc9e4ad7a11ec8bd45a5a692,
title = "Evanescent microwave probe study on dielectric properties of materials",
abstract = "A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution.",
author = "Cheng, {Hsiu Fung} and Yi-Chun Chen and Lin, {I. Nan}",
year = "2006",
month = "4",
day = "11",
doi = "10.1016/j.jeurceramsoc.2005.09.034",
language = "English",
volume = "26",
pages = "1801--1805",
journal = "Journal of the European Ceramic Society",
issn = "0955-2219",
publisher = "Elsevier BV",
number = "10-11",

}

Evanescent microwave probe study on dielectric properties of materials. / Cheng, Hsiu Fung; Chen, Yi-Chun; Lin, I. Nan.

In: Journal of the European Ceramic Society, Vol. 26, No. 10-11, 11.04.2006, p. 1801-1805.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Evanescent microwave probe study on dielectric properties of materials

AU - Cheng, Hsiu Fung

AU - Chen, Yi-Chun

AU - Lin, I. Nan

PY - 2006/4/11

Y1 - 2006/4/11

N2 - A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution.

AB - A recently developed evanescent microwave probe (EMP) technique combined with systematically quantitative analyses is demonstrated. We use a three-dimensional (3D) finite element simulation to model the electromagnetic field inside the resonant cavity and inside the sample near the tip. We also proposed an analysis model for the sample's quality factor (Q), which is usually hindered by the conductor losses of the resonator. Measurement on various dielectric samples agrees very well with the theoretical model, demonstrating the validity of analyses for the EMP resonator and providing a possibility for dielectric imaging the surface of the samples with high resolution.

UR - http://www.scopus.com/inward/record.url?scp=33645539365&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33645539365&partnerID=8YFLogxK

U2 - 10.1016/j.jeurceramsoc.2005.09.034

DO - 10.1016/j.jeurceramsoc.2005.09.034

M3 - Article

AN - SCOPUS:33645539365

VL - 26

SP - 1801

EP - 1805

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

SN - 0955-2219

IS - 10-11

ER -