TY - JOUR
T1 - Evolution of enhanced crystallinity and mechanical property of nanocomposite Ti-Si-N thin films using magnetron reactive co-sputtering
AU - Chung, C. K.
AU - Chang, H. C.
AU - Chang, S. C.
AU - Liao, M. W.
PY - 2012/10/5
Y1 - 2012/10/5
N2 - Nanocomposite Ti-Si-N thin films (nc-TiN/a-SiN x or nc-TiN/a-TiSi xN y) were deposited on Si(1 0 0) substrates from pure Ti and Si targets by magnetron reactive co-sputtering with a negative bias of -150 V. The effects of N 2 flow ratio (FN 2% = FN 2/(FAr + FN 2) × 100%) and Ti power on the evolution of enhanced crystallinity and mechanical properties of Ti-Si-N have been investigated. The crystallinity, morphology, microstructure, elemental composition and mechanical properties of films were characterized by grazing incidence X-ray diffraction (GIXRD), scanning electron microscopy, energy dispersive spectroscopy and nanoindentation, respectively. When both Ti and Si target powers were fixed at 100 W, the GIXRD pattern of Ti-Si-N at 3 FN 2% exhibited a broad peak corresponding to quasi-amorphous microstructure with nanocrystalline grains embedded in an amorphous matrix. Then Ti-Si-N films showed high amount of crystallization with multiple diffraction peaks at 5 FN 2%, but the reduced peak intensity formed at 7 FN 2% and even to be amorphous films without any peak at high 10-20 FN 2%. The measured mean hardnesses of Ti-Si-N films formed at 3, 5, 7, 10 and 20 FN 2% were 18.1, 21.5, 20.4, 17.8 and 15.7 GPa, respectively. Based on the high-hardness Ti-Si-N at constant 5 FN 2%, changing Ti target power from 75 to 200 W could greatly enhance the hardness from 19.0 to 32.0 GPa. Also, the main diffraction of nanocrystalline TiN (nc-TiN) in Ti-Si-N showed poly-orientation from (1 1 1), (2 0 0) and (2 2 0) planes, and the dominant preferred orientation of nc-TiN is along (2 0 0) plane normal. The relationship among parameters, crystallinity and mechanical properties of Ti-Si-N has further been discussed and correlated.
AB - Nanocomposite Ti-Si-N thin films (nc-TiN/a-SiN x or nc-TiN/a-TiSi xN y) were deposited on Si(1 0 0) substrates from pure Ti and Si targets by magnetron reactive co-sputtering with a negative bias of -150 V. The effects of N 2 flow ratio (FN 2% = FN 2/(FAr + FN 2) × 100%) and Ti power on the evolution of enhanced crystallinity and mechanical properties of Ti-Si-N have been investigated. The crystallinity, morphology, microstructure, elemental composition and mechanical properties of films were characterized by grazing incidence X-ray diffraction (GIXRD), scanning electron microscopy, energy dispersive spectroscopy and nanoindentation, respectively. When both Ti and Si target powers were fixed at 100 W, the GIXRD pattern of Ti-Si-N at 3 FN 2% exhibited a broad peak corresponding to quasi-amorphous microstructure with nanocrystalline grains embedded in an amorphous matrix. Then Ti-Si-N films showed high amount of crystallization with multiple diffraction peaks at 5 FN 2%, but the reduced peak intensity formed at 7 FN 2% and even to be amorphous films without any peak at high 10-20 FN 2%. The measured mean hardnesses of Ti-Si-N films formed at 3, 5, 7, 10 and 20 FN 2% were 18.1, 21.5, 20.4, 17.8 and 15.7 GPa, respectively. Based on the high-hardness Ti-Si-N at constant 5 FN 2%, changing Ti target power from 75 to 200 W could greatly enhance the hardness from 19.0 to 32.0 GPa. Also, the main diffraction of nanocrystalline TiN (nc-TiN) in Ti-Si-N showed poly-orientation from (1 1 1), (2 0 0) and (2 2 0) planes, and the dominant preferred orientation of nc-TiN is along (2 0 0) plane normal. The relationship among parameters, crystallinity and mechanical properties of Ti-Si-N has further been discussed and correlated.
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U2 - 10.1016/j.jallcom.2012.05.018
DO - 10.1016/j.jallcom.2012.05.018
M3 - Article
AN - SCOPUS:84863097767
VL - 537
SP - 318
EP - 322
JO - Journal of Alloys and Compounds
JF - Journal of Alloys and Compounds
SN - 0925-8388
ER -