Ex situ structural characterization during the formation of CuInS 2 thin films

Chia Hung Tsai, Jyh-Ming Ting, Rui Ren Wang

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

CuInS2 (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS2-chalcopyrite and the CuInS 2-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu11In9 phase.

Original languageEnglish
Pages (from-to)349-354
Number of pages6
JournalActa Materialia
Volume59
Issue number1
DOIs
Publication statusPublished - 2011 Jan 1

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X ray diffraction analysis
Raman spectroscopy
Thin films
Glass
Substrates
chalcopyrite

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Polymers and Plastics
  • Metals and Alloys

Cite this

Tsai, Chia Hung ; Ting, Jyh-Ming ; Wang, Rui Ren. / Ex situ structural characterization during the formation of CuInS 2 thin films. In: Acta Materialia. 2011 ; Vol. 59, No. 1. pp. 349-354.
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Ex situ structural characterization during the formation of CuInS 2 thin films. / Tsai, Chia Hung; Ting, Jyh-Ming; Wang, Rui Ren.

In: Acta Materialia, Vol. 59, No. 1, 01.01.2011, p. 349-354.

Research output: Contribution to journalArticle

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