Abstract
CuInS2 (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS2-chalcopyrite and the CuInS 2-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu11In9 phase.
| Original language | English |
|---|---|
| Pages (from-to) | 349-354 |
| Number of pages | 6 |
| Journal | Acta Materialia |
| Volume | 59 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2011 Jan 1 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Polymers and Plastics
- Metals and Alloys
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Ex situ structural characterization during the formation of CuInS 2 thin films. / Tsai, Chia Hung; Ting, Jyh-Ming; Wang, Rui Ren.
In: Acta Materialia, Vol. 59, No. 1, 01.01.2011, p. 349-354.Research output: Contribution to journal › Article
TY - JOUR
T1 - Ex situ structural characterization during the formation of CuInS 2 thin films
AU - Tsai, Chia Hung
AU - Ting, Jyh-Ming
AU - Wang, Rui Ren
PY - 2011/1/1
Y1 - 2011/1/1
N2 - CuInS2 (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS2-chalcopyrite and the CuInS 2-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu11In9 phase.
AB - CuInS2 (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS2-chalcopyrite and the CuInS 2-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu11In9 phase.
UR - http://www.scopus.com/inward/record.url?scp=78049526938&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=78049526938&partnerID=8YFLogxK
U2 - 10.1016/j.actamat.2010.09.040
DO - 10.1016/j.actamat.2010.09.040
M3 - Article
VL - 59
SP - 349
EP - 354
JO - Acta Materialia
JF - Acta Materialia
SN - 1359-6454
IS - 1
ER -