Ex situ structural characterization during the formation of CuInS 2 thin films

Chia Hung Tsai; Jyh Ming Ting; Rui Ren Wang

doi:10.1016/j.actamat.2010.09.040

Ex situ structural characterization during the formation of CuInS ₂ thin films

Chia Hung Tsai, Jyh Ming Ting, Rui Ren Wang

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

CuInS₂ (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS₂-chalcopyrite and the CuInS ₂-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu₁₁In₉ phase.

Original language	English
Pages (from-to)	349-354
Number of pages	6
Journal	Acta Materialia
Volume	59
Issue number	1
DOIs	https://doi.org/10.1016/j.actamat.2010.09.040
Publication status	Published - 2011 Jan

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Polymers and Plastics
Metals and Alloys

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10.1016/j.actamat.2010.09.040

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@article{4a3326d4e8244f2fb5e81a211514a670,

title = "Ex situ structural characterization during the formation of CuInS 2 thin films",

abstract = "CuInS2 (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS2-chalcopyrite and the CuInS 2-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu11In9 phase.",

author = "Tsai, {Chia Hung} and Ting, {Jyh Ming} and Wang, {Rui Ren}",

note = "Funding Information: This study was supported by the Taiwan Textile Research Institute under Contract No. P990360. The authors would like to thank for the collaboration of Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan, Taiwan. ",

year = "2011",

month = jan,

doi = "10.1016/j.actamat.2010.09.040",

language = "English",

volume = "59",

pages = "349--354",

journal = "Acta Materialia",

issn = "1359-6454",

publisher = "Acta Materialia Inc",

number = "1",

}

TY - JOUR

T1 - Ex situ structural characterization during the formation of CuInS 2 thin films

AU - Tsai, Chia Hung

AU - Ting, Jyh Ming

AU - Wang, Rui Ren

N1 - Funding Information: This study was supported by the Taiwan Textile Research Institute under Contract No. P990360. The authors would like to thank for the collaboration of Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan, Taiwan.

PY - 2011/1

Y1 - 2011/1

N2 - CuInS2 (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS2-chalcopyrite and the CuInS 2-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu11In9 phase.

AB - CuInS2 (CIS) thin films were deposited on Mo-coated glass substrates using in situ sulfurization of thermally evaporated precursor Cu-In alloys. Samples were removed before, during and after the sulfurization for X-ray diffractometry (XRD) and Raman spectroscopy analysis. While various phases, including the desired CIS, can be identified by XRD, we show that only Raman spectroscopy can reveal the existence of the two structure orders of the CIS phase, namely the CuInS2-chalcopyrite and the CuInS 2-CuAu metastable structure orders. Furthermore, this study also provides direct evidence to show that the CIS phase grows at the expense of an intermediate Cu11In9 phase.

UR - http://www.scopus.com/inward/record.url?scp=78049526938&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=78049526938&partnerID=8YFLogxK

U2 - 10.1016/j.actamat.2010.09.040

DO - 10.1016/j.actamat.2010.09.040

M3 - Article

AN - SCOPUS:78049526938

SN - 1359-6454

VL - 59

SP - 349

EP - 354

JO - Acta Materialia

JF - Acta Materialia

IS - 1

ER -

Ex situ structural characterization during the formation of CuInS ₂ thin films

Abstract

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