Exploring effective charge in electromigration using machine learning

Yu Chen Liu, Benjamin Afflerbach, Ryan Jacobs, Shih Kang Lin, Dane Morgan

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

The effective charge of an element is a parameter characterizing the electromigration effect, which can determine the reliability of interconnection in electronic technologies. In this work, machine learning approaches were employed to model the effective charge (z) as a linear function of physically meaningful elemental properties. Average fivefold (leave-out-alloy-group) cross-validation yielded root-mean-square-error divided by whole data set standard deviation (RMSE/σ) values of 0.37 ± 0.01 (0.22 ± 0.18), respectively, and R2 values of 0.86. Extrapolation to z∗ of totally new alloys showed limited but potentially useful predictive ability. The model was used in predicting z∗ for technologically relevant host-impurity pairs.

Original languageEnglish
Pages (from-to)567-575
Number of pages9
JournalMRS Communications
Volume9
Issue number2
DOIs
Publication statusPublished - 2019 Jun 1

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

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