Extraction of wearout model parameters using on-line test of an SRAM

Shu Han Hsu, Ying Yuan Huang, Yi Da Wu, Kexin Yang, Li Hsiang Lin, Linda Milor

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


To accurately determine the reliability of SRAMs, we propose a method to estimate the wearout parameters of FEOL TDDB using on-line data collected during operations. Errors in estimating lifetime model parameters are determined as a function of time, which are based on the available failure sample size. Systematic errors are also computed due to uncertainty in estimation of temperature and supply voltage during operations, as well as uncertainty in process parameters and use conditions.

Original languageEnglish
Article number113756
JournalMicroelectronics Reliability
Publication statusPublished - 2020 Nov

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering


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