Extraction of wearout model parameters using on-line test of an SRAM

Shu Han Hsu; Ying Yuan Huang; Yi Da Wu; Kexin Yang; Li Hsiang Lin; Linda Milor

doi:10.1016/j.microrel.2020.113756

Extraction of wearout model parameters using on-line test of an SRAM

Shu Han Hsu, Ying Yuan Huang, Yi Da Wu, Kexin Yang, Li Hsiang Lin, Linda Milor

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

To accurately determine the reliability of SRAMs, we propose a method to estimate the wearout parameters of FEOL TDDB using on-line data collected during operations. Errors in estimating lifetime model parameters are determined as a function of time, which are based on the available failure sample size. Systematic errors are also computed due to uncertainty in estimation of temperature and supply voltage during operations, as well as uncertainty in process parameters and use conditions.

Original language	English
Article number	113756
Journal	Microelectronics Reliability
Volume	114
DOIs	https://doi.org/10.1016/j.microrel.2020.113756
Publication status	Published - 2020 Nov

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Safety, Risk, Reliability and Quality
Surfaces, Coatings and Films
Electrical and Electronic Engineering

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10.1016/j.microrel.2020.113756

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title = "Extraction of wearout model parameters using on-line test of an SRAM",

abstract = "To accurately determine the reliability of SRAMs, we propose a method to estimate the wearout parameters of FEOL TDDB using on-line data collected during operations. Errors in estimating lifetime model parameters are determined as a function of time, which are based on the available failure sample size. Systematic errors are also computed due to uncertainty in estimation of temperature and supply voltage during operations, as well as uncertainty in process parameters and use conditions.",

author = "Hsu, {Shu Han} and Huang, {Ying Yuan} and Wu, {Yi Da} and Kexin Yang and Lin, {Li Hsiang} and Linda Milor",

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doi = "10.1016/j.microrel.2020.113756",

language = "English",

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AU - Hsu, Shu Han

AU - Huang, Ying Yuan

AU - Wu, Yi Da

AU - Yang, Kexin

AU - Lin, Li Hsiang

AU - Milor, Linda

PY - 2020/11

Y1 - 2020/11

N2 - To accurately determine the reliability of SRAMs, we propose a method to estimate the wearout parameters of FEOL TDDB using on-line data collected during operations. Errors in estimating lifetime model parameters are determined as a function of time, which are based on the available failure sample size. Systematic errors are also computed due to uncertainty in estimation of temperature and supply voltage during operations, as well as uncertainty in process parameters and use conditions.

AB - To accurately determine the reliability of SRAMs, we propose a method to estimate the wearout parameters of FEOL TDDB using on-line data collected during operations. Errors in estimating lifetime model parameters are determined as a function of time, which are based on the available failure sample size. Systematic errors are also computed due to uncertainty in estimation of temperature and supply voltage during operations, as well as uncertainty in process parameters and use conditions.

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JO - Microelectronics Reliability

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M1 - 113756

ER -

Extraction of wearout model parameters using on-line test of an SRAM

Abstract

All Science Journal Classification (ASJC) codes

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