Fabrication and function examination of PZT-based MEMS accelerometers

Yi Chia Lee, Cheng Che Tsai, Cheng Ying Li, Yu Cheng Liou, Cheng Shong Hong, Sheng Yuan Chu

Research output: Contribution to journalArticlepeer-review

Abstract

In this study, a hybrid sol-gel method was used to fabricate Pb(Zr0.52Ti0.48)0.98Nb0.02O3 (PNZT) piezoelectric thick films. By preparing Pb(Zr0.52Ti0.48)0.98Nb0·02O3 sol-gel solutions and mixing them with PZT-5A piezoelectric powders, therefore, the thickness of single layer coating can be increased and reduce the risk of film cracks. The proposed PNZT films have the dielectric constant of 1750, dielectric loss of 0.063, remnant polarization of 58 μC/cm2, and d33 of 133 p.m./V. Piezoelectric cantilever beam MEMS accelerometers were then designed, simulated and fabricated via photolithography methods on Si substrates. The sensitivity and natural frequency of the cantilever beam accelerometer are 16.8 mV/g and 200Hz, respectively. Finally, a cantilever beam accelerometer is successfully applied for the server hard-drive fault detection.

Original languageEnglish
Pages (from-to)24458-24465
Number of pages8
JournalCeramics International
Volume47
Issue number17
DOIs
Publication statusPublished - 2021 Sep 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Process Chemistry and Technology
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Fabrication and function examination of PZT-based MEMS accelerometers'. Together they form a unique fingerprint.

Cite this