Fail pattern identification for memory built-in self-repair

Rei Fu Huang, Chin Lung Su, Cheng Wen Wu, Shen Tien Lin, Kun Lun Luo, Yeong Jar Chang

Research output: Contribution to journalConference article

4 Citations (Scopus)

Abstract

With the advent of deep submicron technology and System-on-Chip (SOC) design methodology, we are seeing on-chip memory cores to represent a growing percentage of the chip area. The yield of an SOC is usually dominated by the memory yield, so the improvement of memory yield is crucial in SOC development. In this work, we propose a built-in self-repair (BISR) scheme for memory yield improving. The novelty of our approach is that we can identify the fail patterns so that appropriate spare elements (e.g., spare rows, columns, words, or blocks) can be allocated to repair the defective memory. Some BISR methods are discussed and compared. We select the scheme that uses fewer spare elements than others given the same repair rate. The area overhead of the BISR scheme is only 2.2% for an 8K× 64 memory.

Original languageEnglish
Pages (from-to)366-371
Number of pages6
JournalProceedings of the Asian Test Symposium
Publication statusPublished - 2004 Dec 1
EventProceedings of the Asian Test Symposium, ATS'04 - Kenting, Taiwan
Duration: 2004 Nov 152004 Nov 17

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Repair
Data storage equipment
System-on-chip

All Science Journal Classification (ASJC) codes

  • Media Technology
  • Hardware and Architecture

Cite this

Huang, R. F., Su, C. L., Wu, C. W., Lin, S. T., Luo, K. L., & Chang, Y. J. (2004). Fail pattern identification for memory built-in self-repair. Proceedings of the Asian Test Symposium, 366-371.
Huang, Rei Fu ; Su, Chin Lung ; Wu, Cheng Wen ; Lin, Shen Tien ; Luo, Kun Lun ; Chang, Yeong Jar. / Fail pattern identification for memory built-in self-repair. In: Proceedings of the Asian Test Symposium. 2004 ; pp. 366-371.
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Huang, RF, Su, CL, Wu, CW, Lin, ST, Luo, KL & Chang, YJ 2004, 'Fail pattern identification for memory built-in self-repair', Proceedings of the Asian Test Symposium, pp. 366-371.

Fail pattern identification for memory built-in self-repair. / Huang, Rei Fu; Su, Chin Lung; Wu, Cheng Wen; Lin, Shen Tien; Luo, Kun Lun; Chang, Yeong Jar.

In: Proceedings of the Asian Test Symposium, 01.12.2004, p. 366-371.

Research output: Contribution to journalConference article

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T1 - Fail pattern identification for memory built-in self-repair

AU - Huang, Rei Fu

AU - Su, Chin Lung

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AU - Luo, Kun Lun

AU - Chang, Yeong Jar

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