Failure-Pattern-Based Test Data Compression for Memories

Cheng-Wen Wu, B.-Y. Lin, M. Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationVLSI Test Technology Workshop (VTTW)
Place of PublicationNew Taipei City
Publication statusPublished - 2013 Jul

Cite this