| Original language | English |
|---|---|
| Title of host publication | VLSI Test Technology Workshop (VTTW) |
| Place of Publication | New Taipei City |
| Publication status | Published - 2013 Jul |
Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver
Failure-Pattern-Based Test Data Compression for Memories
Cheng-Wen Wu, B.-Y. Lin, M. Lee
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution