Abstract
In this paper, we propose a fast and memory-efficient algorithm to estimate the glitch effects of the circuit under a general delay model without constructing global BDDs and without calculating Boolean difference. A new concept, where the circuit's signal activities with and without glitching effects are separately calculated by two newly developed calculation modules, is developed. The combined Markov chain and BAM method is used, and approximates the transient signals behavior with the steady state behavior, then the glitching effects as well as the temporal and spatial correlations among signals are all considered and processed efficiently. The analysis of our method indicates that it is applicable to large size circuits with acceptable errors.
Original language | English |
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Pages (from-to) | 53-56 |
Number of pages | 4 |
Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
Volume | 6 |
Publication status | Published - 1998 Jan 1 |
Event | Proceedings of the 1998 IEEE International Symposium on Circuits and Systems, ISCAS. Part 5 (of 6) - Monterey, CA, USA Duration: 1998 May 31 → 1998 Jun 3 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering