Fast deterministic test pattern generation for scan-based bist environment

W. L. Wang, K. J. Lee

Research output: Contribution to journalArticlepeer-review


Linear feedback shift registers (LFSRs) have been used to generate both pseudorandom and deterministic patterns in the scan-based built-in self-test environment in order to raise the fault coverage and reduce test cost. However, like other scan-based methods, the LFSR-based pattern generation schemes take a long test application time on feeding deterministic patterns from the LFSR into a scan chain. In this paper we derive a generalized relationship between the bits in the original scan chain and the states of the LFSR such that the bits generated by an LFSR in any future clock cycle can be pre-generated by the proposed test pattern generator. With this relationship, we can divide a scan chain into multiple sub-chains and use an LFSR-based multiple sequence generator to simultaneously generate all the subsequences required by the sub-chains. Hence, we can greatly reduce the test application time.

Original languageEnglish
Pages (from-to)365-376
Number of pages12
JournalJournal of the Chinese Institute of Electrical Engineering, Transactions of the Chinese Institute of Engineers, Series E/Chung KuoTien Chi Kung Chieng Hsueh K'an
Issue number4
Publication statusPublished - 2001 Nov 1

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


Dive into the research topics of 'Fast deterministic test pattern generation for scan-based bist environment'. Together they form a unique fingerprint.

Cite this