Fast identification of operating current for toggle MRAM by spiral search

Sheng Hung Wang, Ching Yi Chen, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Magnetic Random Access Memory (MRAM) is a non-volatile memory which is widely studied for its high speed, high density, small cell size, and almost unlimited endurance. However, for deep-submicron process technologies, significant variation in MRAM cells' operating regions results in write failures in cells and reduces the production yield. Currently, memory designers characterize failed MRAM chips to find a suitable current level for reconfiguring their operating current, which is timeconsuming. In this paper, we propose an efficient operating current search method and a built-in circuit for toggle MRAM, which can rapidly find a customized operating current for each MRAM chip. With the built-in circuit, an MRAM chip can dynamically reconfigure its operating current automatically. Production yield and product life-time thus can be increased.

Original languageEnglish
Title of host publicationProceedings of the 47th Design Automation Conference, DAC '10
Pages923-928
Number of pages6
DOIs
Publication statusPublished - 2010 Sep 7
Event47th Design Automation Conference, DAC '10 - Anaheim, CA, United States
Duration: 2010 Jun 132010 Jun 18

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Other

Other47th Design Automation Conference, DAC '10
CountryUnited States
CityAnaheim, CA
Period10-06-1310-06-18

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modelling and Simulation

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  • Cite this

    Wang, S. H., Chen, C. Y., & Wu, C. W. (2010). Fast identification of operating current for toggle MRAM by spiral search. In Proceedings of the 47th Design Automation Conference, DAC '10 (pp. 923-928). (Proceedings - Design Automation Conference). https://doi.org/10.1145/1837274.1837506