Fault Diagnosability of Networks With Fault-Free Block at Local Vertex Under MM∗ Model

Yanze Huang, Limei Lin, Yuhang Lin, Li Xu, Sun Yuan Hsieh

Research output: Contribution to journalArticlepeer-review

Abstract

In order to evaluate the reliability of a multiprocessor system, the fault diagnosability was introduced and utilized as a significant indicator. In the study of fault diagnosability, researchers usually concentrate on the diagnosability of the global system but ignore its local information. However, the local information also plays a crucial role in the reliability of a multiprocessor system. Thus, an innovative concept of fault diagnosability, called y-fault-free-block local fault diagnosability, is put forward to study the fault diagnosability of a multiprocessor system at local vertex, where the y-fault-free-block condition requires more than y connected vertices. In this article, we characterize several important properties about the y-fault-free-block local fault diagnosability of a multiprocessor interconnection network under the MM∗ model and propose its y-fault-free-block local fault diagnosability at local vertex. Furthermore, we apply our results to some well-known networks, and we obtain their y-fault-free-block local fault diagnosabilities at local vertex directly under the MM∗ model, including bijective connection graph, star graph, and (n,k)-star graph. Finally, we compare the y-fault-free-block local fault diagnosability of a graph at local vertex with other types of diagnosability, including the diagnosability, conditional diagnosability, good-neighbor diagnosability, and pessimistic diagnosability. It can be seen that the y-fault-free-block local fault diagnosability at vertex is larger than all the other types of diagnosability.

Original languageEnglish
Pages (from-to)372-383
Number of pages12
JournalIEEE Transactions on Reliability
Volume72
Issue number1
DOIs
Publication statusPublished - 2023 Mar 1

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

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