Original language | English |
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Title of host publication | VLSI Test Technology Workshop (VTTW) |
Place of Publication | Nantou |
Publication status | Published - 2017 Jul |
Fault Models and Test Algorithms for Multi-Level Cell (MLC) Crossbar RRAM
Cheng-Wen Wu, K.-W. Hou
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution