Fault-pattern oriented defect diagnosis for flash memory

Mu Hsien Hsu, Yu Tsao Hsing, Jen Chieh Yeh, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In order to ease the time-to-market pressure of flash memory, we propose a fault-pattern based diagnosis methodology that reduces the burden in yield learning. The fault-pattern based diagnosis approach is based on defect dictionary and ATE log file. The proposed diagnosis method allows product engineers to quickly isolate defect candidates. In this paper we use open/short defects to demonstrate our method. We propose a diagnostic test algorithm for flash memory based on the targeted defect models. The length of the new diagnostic test is shorter than previous ones, so diagnosis time can be reduced. Experimental results show that the diagnostic resolution of fault-pattern based method reaches 83.3% for a NOR-type flash, and 100% for a NAND-type flash. We also present a current test to improve the diagnostic resolution for NOR-type flash, so its diagnostic resolution can reach 100% as well.

Original languageEnglish
Title of host publicationProceedings - 2006 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT'06
Pages3-8
Number of pages6
DOIs
Publication statusPublished - 2006 Dec 1
Event2006 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT'06 - Taipei, Taiwan
Duration: 2006 Aug 22006 Aug 4

Publication series

NameRecords of the IEEE International Workshop on Memory Technology, Design and Testing
Volume2006
ISSN (Print)1087-4852

Conference

Conference2006 IEEE International Workshop on Memory Technology, Design, and Testing, MTDT'06
Country/TerritoryTaiwan
CityTaipei
Period06-08-0206-08-04

All Science Journal Classification (ASJC) codes

  • Media Technology

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