Femtosecond time-resolved HAXPES

Lars Philip Oloff, Masaki Oura, Ashish Chainani, Kai Rossnagel

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Citations (Scopus)

Abstract

The problems, progress, and prospects of time-resolved hard X-ray photoelectron spectroscopy (TR-HAXPES) using X-ray free-electron laser (XFEL) radiation are discussed. This novel photoemission technique is characterized by a unique combination of femtosecond time resolution and bulk sensitivity with momentum selectivity and sensitivity to the atomic site-specific chemical and structural environment. TR-HAXPES will in particular enable us to simultaneously study the ultrafast electron and structural dynamics in the bulk of complex materials and electronic devices.

Original languageEnglish
Title of host publicationSpringer Series in Surface Sciences
PublisherSpringer Verlag
Pages555-568
Number of pages14
DOIs
Publication statusPublished - 2016 Jan 1

Publication series

NameSpringer Series in Surface Sciences
Volume59
ISSN (Print)0931-5195

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

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