Femtosecond ultrasonic spectroscopy using a piezoelectric nanolayer: Hypersound attenuation in vitreous silica films

Yu Chieh Wen; Shi Hao Guol; Hung Pin Chen; Jinn Kong Sheu; Chi Kuang Sun

doi:10.1063/1.3620879

Femtosecond ultrasonic spectroscopy using a piezoelectric nanolayer: Hypersound attenuation in vitreous silica films

Yu Chieh Wen
, Shi Hao Guol
, Hung Pin Chen
, Jinn Kong Sheu
, Chi Kuang Sun

Department of Photonics

Research output: Contribution to journal › Article › peer-review

24 Citations (Scopus)

Abstract

We report ultra-broadband ultrasonic spectroscopy with an impedance-matched piezoelectric nanolayer, which enables optical generation and detection of a 730-fs acoustic pulse (the width of ten lattice constants). The bandwidth improvement facilitates THz laser ultrasonics to bridge the spectral gap between inelastic light and x-ray scatterings (0.1-1 THz) in the studies of lattice dynamics. As a demonstration, this method is applied to measure sound attenuation in a vitreous SiO₂ thin film. Our results extend the existing low-frequency data obtained by ultrasonic-based and light scattering methods and also show a f² behavior for frequencies f up to 650 GHz.

Original language	English
Article number	051913
Journal	Applied Physics Letters
Volume	99
Issue number	5
DOIs	https://doi.org/10.1063/1.3620879
Publication status	Published - 2011 Aug 1

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.3620879

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title = "Femtosecond ultrasonic spectroscopy using a piezoelectric nanolayer: Hypersound attenuation in vitreous silica films",

abstract = "We report ultra-broadband ultrasonic spectroscopy with an impedance-matched piezoelectric nanolayer, which enables optical generation and detection of a 730-fs acoustic pulse (the width of ten lattice constants). The bandwidth improvement facilitates THz laser ultrasonics to bridge the spectral gap between inelastic light and x-ray scatterings (0.1-1 THz) in the studies of lattice dynamics. As a demonstration, this method is applied to measure sound attenuation in a vitreous SiO2 thin film. Our results extend the existing low-frequency data obtained by ultrasonic-based and light scattering methods and also show a f2 behavior for frequencies f up to 650 GHz.",

author = "Wen, \{Yu Chieh\} and Guol, \{Shi Hao\} and Chen, \{Hung Pin\} and Sheu, \{Jinn Kong\} and Sun, \{Chi Kuang\}",

note = "Funding Information: The authors would like to thank O. Matsuda and S. Asefi for inspiring scientific discussions. This work was sponsored by the National Science of Taiwan under Grant No. NSC-99-2120-M-002-013.",

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AU - Wen, Yu Chieh

AU - Guol, Shi Hao

AU - Chen, Hung Pin

AU - Sheu, Jinn Kong

AU - Sun, Chi Kuang

N1 - Funding Information: The authors would like to thank O. Matsuda and S. Asefi for inspiring scientific discussions. This work was sponsored by the National Science of Taiwan under Grant No. NSC-99-2120-M-002-013.

PY - 2011/8/1

Y1 - 2011/8/1

N2 - We report ultra-broadband ultrasonic spectroscopy with an impedance-matched piezoelectric nanolayer, which enables optical generation and detection of a 730-fs acoustic pulse (the width of ten lattice constants). The bandwidth improvement facilitates THz laser ultrasonics to bridge the spectral gap between inelastic light and x-ray scatterings (0.1-1 THz) in the studies of lattice dynamics. As a demonstration, this method is applied to measure sound attenuation in a vitreous SiO2 thin film. Our results extend the existing low-frequency data obtained by ultrasonic-based and light scattering methods and also show a f2 behavior for frequencies f up to 650 GHz.

AB - We report ultra-broadband ultrasonic spectroscopy with an impedance-matched piezoelectric nanolayer, which enables optical generation and detection of a 730-fs acoustic pulse (the width of ten lattice constants). The bandwidth improvement facilitates THz laser ultrasonics to bridge the spectral gap between inelastic light and x-ray scatterings (0.1-1 THz) in the studies of lattice dynamics. As a demonstration, this method is applied to measure sound attenuation in a vitreous SiO2 thin film. Our results extend the existing low-frequency data obtained by ultrasonic-based and light scattering methods and also show a f2 behavior for frequencies f up to 650 GHz.

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Femtosecond ultrasonic spectroscopy using a piezoelectric nanolayer: Hypersound attenuation in vitreous silica films

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