FFT Butterfly Network Design for Easy Testing

Cheng Wen Wu, Chen Ti Chang

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

We consider off-line testing and easily testable design of butterfly networks for fast Fourier transform. The butterfly networks are shown to be testable with 32 patterns using a design-for-testability technique based on the M-testability conditions. The functional-level cell-fault model is assumed, and the fault coverage for combinational single cell faults is 100%. A higher-level fault model-the module-fault model-is also discussed. We present a novel input-assignment technique based on the functional byectivity property of the butterfly modules to discover faults other than the cell faults (e.g., interconnection faults).

Original languageEnglish
Pages (from-to)110-115
Number of pages6
JournalIEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
Volume40
Issue number2
DOIs
Publication statusPublished - 1993 Jan 1

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'FFT Butterfly Network Design for Easy Testing'. Together they form a unique fingerprint.

Cite this