@inproceedings{784c8fe017964cfca883ae43b446fd57,
title = "Flash memory built-in self-test using march-like algorithms",
abstract = "Flash memories are a type of non-volatile memory based on floating-gate transistors. The use of commodity and embedded flash memories are growing rapidly as we enter the system-on-chip (SOC) era. Conventional tests for flash memories are usually ad hoc-the test procedure is developed for a specific design. We propose improved March-like algorithms (i.e., March FT) for both bit-oriented and word-oriented flash memory, to cover the disturbance faults derived from the IEEE 1005 Standard, as well as conventional faults. A noval flash memory fault simulator is used to analyze and generate the test algorithms. In addition, we present BIST designs for two industrial flash memories. The area overhead is only about 3% for a medium-sized flash memory.",
author = "Yeh, {Jen Chieh} and Wu, {Chi Feng} and Cheng, {Kuo Liang} and Chou, {Yung Fa} and Huang, {Chih Tsun} and Wu, {Cheng Wen}",
year = "2002",
month = jan,
day = "1",
doi = "10.1109/DELTA.2002.994602",
language = "English",
series = "Proceedings - 1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "137--141",
editor = "M. Renovell and S. Kajihara and S. Demidenko and I. Al-Bahadly",
booktitle = "Proceedings - 1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002",
address = "United States",
note = "1st IEEE International Workshop on Electronic Design, Test and Applications, DELTA 2002 ; Conference date: 29-01-2002 Through 31-01-2002",
}