| Original language | English |
|---|---|
| Title of host publication | 15th VLSI Design/CAD Symposium |
| Place of Publication | Pingtung |
| Publication status | Published - 2004 Aug |
Flash memory built-in self-test with enhanced test mode control
Cheng-Wen Wu, Y.-T. Lai, J.-C. Yeh, C.-H. Ho
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution