Abstract
Flip-chip p(GaN)-i(GaN)-n(AlGaN) photosensors with extremely low dark currents were fabricated and characterized. It was found that the sensor with a 0.5-μm-thick Si-doped n +-Al 0.15Ga 0.85N layer could only detect optical signals with wavelength in between 325 and 360 nm. With an incident wavelength of 355 nm, the authors achieved a peak responsivity of 0.16 A/W at zero bias, which corresponds to an external quantum efficiency of 56%.
Original language | English |
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Article number | 1661579 |
Pages (from-to) | 964-968 |
Number of pages | 5 |
Journal | IEEE Sensors Journal |
Volume | 6 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2006 Aug |
All Science Journal Classification (ASJC) codes
- Instrumentation
- Electrical and Electronic Engineering